Probe Cards
Probe cards are precision interface tools used to establish reliable electrical contact between test equipment and semiconductor wafers during wafer-level testing. They ensure accurate signal transmission, enabling high-quality device characterization and manufacturing yield control.
Cost effective | Fast turn-around | Heat resistance
Vertical probe cards utilize vertically aligned probes, including buckling beam and MEMS technologies, to deliver high-density and high-precision wafer testing. They offer superior signal integrity and are ideal for advanced semiconductor devices with fine-pitch and high-frequency requirements.
WLCSP | High Pin Counts | Field Replaceable
Cantilever probe cards are designed for reliable electrical contact using horizontally extended probe tips that touch the wafer pads. They are widely used for low to medium pin-count applications requiring proven stability and cost-effective wafer testing.
Pogo pin probe cards use spring-loaded pins to ensure consistent and repeatable contact during wafer testing. They are well-suited for applications requiring durability, high cycle life, and stable performance across repeated test operations.
High Pin Counts | Large Array | Precise Probe Marks
