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5G

RF

mmWave

TEST SOLUTIONS

JF Technology group offers High-Performance Contacting Technology that provides nearly transparent effects on your test results. Our products provide reliable, repeatable, electrical and mechanical performance to meet the stringent demands of high frequency testing such as bandwidth and power. Contacting and ground configurations are easily customizable to meet your needs. Solutions are geared for smooth transition from initial lab characterization through high-volume production test environments 

EZ Family of Contacting Technology

  • Available in 1.00 and 2.00mm  electrical lengths

  • Single elastomer biased rigid style  with horizontal off-set (IC package and load board ends)

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Eta.5 Family of Contacting Technology

  • Available in 0.50mm electrical length

  • Single elastomer biased rigid style  with horizontal off-set (IC package and load board ends)

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Zigma Family of Contacting Technology

  • Available in 0.50, 1.00, and 2.00mm electrical lengths

  • Dual elastomer biased rigid style  with horizontal off-set (IC package and load board ends)

BELLMAT

UNICON

GROUNDING SOLUTIONS

CONDUCTIVE FLAT/SOLID

  • Material: 
    Beryllium Copper/Nickel/Gold/(BeCu/Ni/Au)

  • Feature:

    • Maximum surface area contact

CONDUCTIVE FLAT/SOLID

  • Material: Beryllium Copper/Nickel/Gold/(BeCu/Ni/Au)

  • Feature:

    • Maximum surface area contact

    • Self-cleaning micro wipe

    • Vertical compliance

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Your Partner 

for High Performance Test Contacting Solutions

Contact us today for consultation so that we could address your needs

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